Call for Papers Journal Applied Stochastic Models in Business and Industry [Wiley InterScience ISSN 1524-1904, http://www.interscience.wiley.com] is considering a special issue on Wavelets and Other Multiscale Methods: Theory and Applications. We invite contributions for the Special Issue that are good balance of theory and applications of wavelets and other multiscale methods in industry, finance, and applied sciences. For your information a brief description of aims and scope of the Journal is attached. Submit three copies of the manuscript to either: Guest Editor: Brani Vidakovic, ISyE, Georgia Institute of Technology, 765 Ferst Dr Atlanta, Georgia 30332-0205, USA (404) 894-3935 (Phone), (404) 894-2301 (Fax) email: brani@isye.gatech.edu or Editor-in-Chief: Jef Teugels, University Centre for Statistics, Katholieke Universiteit Leuven, DeCroylaan 52B 3001 Heverlee, Belgium (+32 16) 322-786 (Phone), (+32 16) 322-831 (Fax) jef.teugels@wis.kuleuven.ac.be with a note "For Special Issue on Wavelets." Time-table (Note: Time table is extended compared to the first call): Submission of Manuscripts: till October 2001 Review Process Ends: Spring, 2002 Publishing Process Starts: Summer, 2002 -------------- Aims and Scope of the Journal Applied Stochastic Models in Business and Industry (formerly Applied Stochastic Models and Data Analysis) was first published in 1985, publishing contributions in the interface between stochastic modeling, data analysis and their applications in business, finance, insurance, management and production. The main objective is to publish papers, both technical and practical, presenting new results which solve real-life problems or have great potential in doing so. A second objective is to present new methods for solving such problems, i.e., optimization, data base management, knowledge acquisition, expert systems, computer added decision supports and neural computing. The scope of the journal is now broadened both in supporting topics and in appropriate methodology. Topics to be added include managerial process reliability, quality control, data analysis and data mining. New methodologies include wavelets, Markov-chain Monte Carlo methods and spatial statistics.